TUSIEF, Muhammad Qamar et al. Integration of Microelectronics in Specialty Yarns: Challenges in Durability and Scalable Manufacturing. ACADEMIA International Journal for Social Sciences, [S. l.], v. 5, n. 3(s5), p. 159–164, 2026. DOI: 10.63056/academia.5.3(s5).2026.1961. Disponível em: https://academia.edu.pk/index.php/Journals/article/view/1961. Acesso em: 21 jun. 2026.